plesty.lib.test.device_param_system
===================================

.. py:module:: plesty.lib.test.device_param_system

.. autoapi-nested-parse::

   Automated configuration parameter testing utilities for Plesty devices.



Functions
---------

.. autoapisummary::

   plesty.lib.test.device_param_system._generate_param_value
   plesty.lib.test.device_param_system._bind_mock_param_solver
   plesty.lib.test.device_param_system.assert_mock_param_solver_bound
   plesty.lib.test.device_param_system._query_test
   plesty.lib.test.device_param_system._write_test
   plesty.lib.test.device_param_system.auto_test


Module Contents
---------------

.. py:function:: _generate_param_value(param, generator: plesty.lib.sim.data_generator.DataGenerator)

   Generate a value for one config parameter using metadata-first rules.


.. py:function:: _bind_mock_param_solver(device, generator: plesty.lib.sim.data_generator.DataGenerator)

   Bind mock read/write handlers for config parameter tests.

   Some real devices require network or hardware access. The mock path keeps
   auto tests deterministic and side-effect free by storing writes in-memory
   and generating schema-compatible query responses.


.. py:function:: assert_mock_param_solver_bound(device: Any, when: str) -> None

   Assert the mock handlers are the ones answering.

   A device that rebinds ``_write_`` or ``_query_`` — during connect, or on
   the first query, or by falling back to its own internal mock — turns this
   gate into a test of nothing. plesty-lib#27 is the precedent: a failed
   connect fell back to a mock solver and three gates reported success having
   measured nothing.

   :param device: The device under test.
   :param when: Where in the sweep the check runs; quoted in the failure message.

   :raises AssertionError: If either handler no longer points at the mock.


.. py:function:: _query_test(device, key: str)

.. py:function:: _write_test(device, key: str, value: Any)

.. py:function:: auto_test(device_cls: Any, *args: Any, use_mock_solver: bool = True, ignore_keys: Any = None, seed: int | None = 123, sleep_time: float = 0.1, device_kwargs: dict[str, Any] | None = None, **kwargs: Any) -> None

   Auto test parameter read/write paths for a device class.

   This test can optionally bind mock config read/write handlers and uses
   ``DataGenerator`` to produce values from ``ConfigParameter`` metadata.

   :param device_cls: The device class under test.
   :param \*args: Positional arguments forwarded to ``device_cls``.
   :param use_mock_solver: Bind the in-memory handlers instead of talking to the
                           device's own transport.
   :param ignore_keys: Configuration keys to skip.
   :param seed: RNG seed for reproducible generated values.
   :param sleep_time: Delay between keys, to avoid overwhelming an instrument.
                      Ignored under *use_mock_solver*: there is no instrument to pace,
                      and a fifty-parameter module spent five seconds asleep in CI.
   :param device_kwargs: Keyword arguments forwarded to ``device_cls``, kept
                         apart from this function's own. A device constructor taking a
                         ``use_mock_solver`` or ``seed`` argument — one reference module
                         takes the first — collides with the parameters above when the
                         two are merged, and the call fails with "got multiple values".
   :param \*\*kwargs: Keyword arguments forwarded to ``device_cls``. Prefer
                      *device_kwargs* for anything that might share a name.

   :raises AssertionError: If any parameter failed to read or round-trip.